AFM Laboratory is equipped with MultiMode VIII (Bruker) Atomic Force Microscope (AFM), which belongs to Scanning Probe Microscopies (SPM) family. It enables investigation of surface topography with nanometric resolution. Based on topography data a number of parameters can be calculated, including surface roughness, grain/aggregate/feature/pore size, or scratch depth. Surface scan can be conducted in contact, semicontact (Tapping) or PeakForceTapping mode. Microscope is equipped with Quantitative Nanomechanical Mapping (QNM) module and diamond probe which enables investigation into mechanical properties of sample surface (e.g. DMT modulus, adhesion). Additionally other properties can be investigated using Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) or using modified probe. The size of scanned surface may vary between 100 μm and 250 nm in XY plane with up to 5 μm in Z axis. The resolution can reach 0.02 nm in Z axis and 2 nm in XY plane (resolution varies based on sample and probe properties, mode of operation and scan size). Measurements can be performed in either air or aqueous solution.